Microstructue Observation of Nanoporous Membrane Using Transmission Electron Microscope

Conventional Transmission Electron Microscope Observation of Electric and Magnetic Fields

Observation of semiconductor elements using scanning electron microscope.

Transmission electron microscope observation of organic–inorganic hybrid thin active layers of light-emitting diodes

We performed transmission electron microscope (TEM) observation of organic-inorganic hybrid thin films fabricated by the sol-gel reaction and used as the active layers of organic light-emitting diodes. The cross-sectional TEM images show that the films consist of a triple-layer structure. To evaluate the composition of these layers, the distribution of atoms in them was measured by energy-dispe...

Isotope analysis in the transmission electron microscope

The Ångström-sized probe of the scanning transmission electron microscope can visualize and collect spectra from single atoms. This can unambiguously resolve the chemical structure of materials, but not their isotopic composition. Here we differentiate between two isotopes of the same element by quantifying how likely the energetic imaging electrons are to eject atoms. First, we measure the dis...

Electron microscopy’s multi-tool: the Scanning Transmission Electron Microscope

A dedicated Scanning Transmission Electron Microscope is ideally coupled with the energy dispersive x-ray and electron energy loss spectroscopies to obtain information about the chemical composition, morphology and electronic structure on the nanoscale. With several signals being available simultaneously with the pass of a subnanometre-sized beam, this instrument can answer questions from a bro...